Automatic Test Data Generation from Embedded C Code 1st Edition by Eileen Dillon, Christophe Meudec ISBN 9783540301387

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ISBN 10: 
ISBN 13: 9783540301387
Author: Eileen Dillon, Christophe Meudec

A fundamental area of software engineering that remains a challenge for software developers is the delivery of software with the minimum of remaining defects. While progress is constantly being made in the provision of static analysis tools to partly address this problem, the complementary dynamic testing approach, which remains an essential technique in the software industry for the verification and validation of software, has received less attention. Within the software testing activity, the actual generation of test data for the purpose of automated software testing is still mainly a manual task. We present CSET (C Symbolic Execution Tool) which automatically generates test data from C source code to fulfil code coverage criteria. CSET implements the symbolic execution technique with an intermediate path traversal conditions checker and a test data generation facility. We examine how the traditional problems associated with the symbolic execution technique have been overcome using Logic Programming and Constraint Logic Programming (CLP). The approach used to handle pointer manipulations is detailed. Interprocedural results on previously published sample code and industrial embedded C code with pointers are presented.

Automatic Test Data Generation from Embedded C Code 1st Table of contents:

• Background and Fundamentals

  • 2.1 Embedded Systems: Characteristics and Constraints
  • 2.2 Software Testing: Overview and Techniques
  • 2.3 Automated Test Data Generation: Concepts and Methods
  • 2.4 The Role of Static and Dynamic Analysis in Test Generation
  • 2.5 Formal Methods for Test Data Generation

• Test Data Generation Techniques

  • 3.1 Code Coverage Criteria
  • 3.2 Path Coverage and Control Flow Analysis
  • 3.3 Data Flow Coverage
  • 3.4 Mutation Testing in Embedded C Code
  • 3.5 Random Testing vs. Guided Testing
  • 3.6 Constraint Solving for Input Data Generation

• Analysis of Embedded C Code for Test Data Generation

  • 4.1 Static Code Analysis and Parsing Techniques
  • 4.2 Abstract Syntax Trees (ASTs) and Intermediate Representations
  • 4.3 Identifying Control Structures and Data Dependencies
  • 4.4 Handling External Libraries and Hardware Interaction
  • 4.5 Dealing with Timing and Resource Constraints

• Automated Test Data Generation Tools

  • 5.1 Overview of Available Tools
  • 5.2 Tool Selection Criteria
  • 5.3 Case Study: Using X Tool for Test Data Generation
  • 5.4 Integrating Test Data Generation in Embedded Development Workflow
  • 5.5 Comparison of Open-Source vs. Commercial Tools

• Challenges and Solutions

  • 6.1 Challenges in Handling Non-Deterministic Behavior
  • 6.2 Addressing Limitations of Static Analysis in Complex Systems
  • 6.3 Generating Test Data for Hardware-Dependent Code
  • 6.4 Ensuring Coverage and Redundancy Minimization
  • 6.5 Test Oracle Problem in Embedded Systems

• Case Studies and Applications

  • 7.1 Industrial Application of Test Data Generation
  • 7.2 Case Study: Automotive Embedded Systems
  • 7.3 Case Study: Medical Devices Software Testing
  • 7.4 Case Study: Embedded Software in IoT Devices
  • 7.5 Case Study: Aerospace and Safety-Critical Systems

• Advanced Topics in Test Data Generation

  • 8.1 Machine Learning Approaches to Test Data Generation
  • 8.2 Evolutionary Testing for Embedded Systems
  • 8.3 Hybrid Approaches: Combining Symbolic Execution and Testing
  • 8.4 Test Data Generation for Multi-threaded and Real-Time Systems

• Best Practices for Implementing Test Data Generation

  • 9.1 Designing Testable Embedded C Code
  • 9.2 Automating Test Generation in CI/CD Pipelines
  • 9.3 Test Maintenance and Update Strategies
  • 9.4 Combining Static and Dynamic Testing Techniques
  • 9.5 Managing Test Data for Regression Testing

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